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HEF4794B Ver la hoja de datos (PDF) - NXP Semiconductors.

Número de pieza
componentes Descripción
Fabricante
HEF4794B
NXP
NXP Semiconductors. NXP
HEF4794B Datasheet PDF : 18 Pages
First Prev 11 12 13 14 15 16 17 18
NXP Semiconductors
HEF4794B
8-stage shift-and-store register LED driver
VI
90 %
input pulse
10 %
VSS
tr
VI
G
VDD
DUT
RT
tf
VEXT
RL
VO
CL
001aag804
Test data is given in Table 10.
Definitions for test circuit:
DUT - Device Under Test.
RL = Load resistance.
CL = load capacitance.
RT = Termination resistance should be equal to output impedance of Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
Table 10. Test data
Supply
Input
VDD
VI
5 V to 15 V
VDD
tr, tf
20 ns
VEXT
tPLZ, tPZL
VDD
tPLH, tPHL
open
Load
CL
50 pF
RL
1 k
HEF4794B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 16 November 2011
© NXP B.V. 2011. All rights reserved.
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