HA-5340/883 Ver la hoja de datos (PDF) - Intersil
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HA-5340/883 Datasheet PDF : 12 Pages
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HA5340
DESIGN INFORMATION (Continued)
The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica-
tion and design information only. No guarantee is implied.
Test Circuits
HOLD STEP ERROR AND DROOP RATE
S/H
CONTROL
INPUT
1
-INPUT
2
+INPUT
7
OUTPUT
VO
8
N.C.
14
S/H CONTROL
11
N.C.
HA-5340
(CH = 135pF = INTERNAL)
HOLD STEP ERROR
1. Observe the ‘‘hold step’’ voltage Vp:
S/H CONTROL
VO
Vp
HOLD (4.0V)
SAMPLE (0V)
DROOP RATE TEST
1. Observe the voltage ‘‘droop’’, ∆VO/∆T:
S/H CONTROL
HOLD (4.0V)
SAMPLE (0V)
VO
∆VO
∆T
2. Measure the slope of the output during hold, ∆VO /∆T.
3. Droop can be positive or negative - usually to one rail or the other
not to GND.
VIN
20Vp-p
200kHz
SINE WAVE
S/H CONTROL
INPUT
HOLD MODE FEED THROUGH ATTENUATION
ANALOG
MUX OR
SWITCH
AIN
+V
-V
HA-5340
9
5
1
-IN
2
+IN
14 S/H
CONTROL
SUPPLY
GND
13
CH
11
7
OUT
REF
COM
6
TO
SUPPLY
COMMON
N.C.
TO
SIGNAL
GND
VOUT
Feedthrough in dB = 20 Log VOUT where:
VIN
VOUT = Voltsp-p, Hold Mode,
VIN = Voltsp-p.
7-16
Spec Number 511117-883
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