1SMB11CAT3(2001) Ver la hoja de datos (PDF) - ON Semiconductor
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1SMB11CAT3 Datasheet PDF : 8 Pages
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1SMB10CAT3 Series
OVERSHOOT DUE TO
V
Vin (TRANSIENT)
V INDUCTIVE EFFECTS
VL
Vin
td
tD = TIME DELAY DUE TO CAPACITIVE EFFECT
t
Figure 4.
Figure 5.
Vin (TRANSIENT)
VL
t
1
0.7
0.5
0.3
0.2
0.1
0.07
0.05
0.03
0.02
0.01
0.1 0.2
PULSE WIDTH
10 ms
1 ms
100 µs
10 µs
0.5 1 2
5 10 20
D, DUTY CYCLE (%)
50 100
Figure 6. Typical Derating Factor for Duty Cycle
UL RECOGNITION
The entire series has Underwriters Laboratory
Recognition for the classification of protectors (QVGV2)
under the UL standard for safety 497B and File #116110.
Many competitors only have one or two devices recognized
or have recognition in a non-protective category. Some
competitors have no recognition at all. With the UL497B
recognition, our parts successfully passed several tests
including Strike Voltage Breakdown test, Endurance
Conditioning, Temperature test, Dielectric
Voltage-Withstand test, Discharge test and several more.
Whereas, some competitors have only passed a
flammability test for the package material, we have been
recognized for much more to be included in their Protector
category.
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