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M3488B1 Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza
componentes Descripción
Fabricante
M3488B1
STMICROELECTRONICS
STMicroelectronics STMICROELECTRONICS
M3488B1 Datasheet PDF : 18 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
A.C. ELECTRICAL CHARACTERISTICS (continued)
Signal
CS1, CS2
C/D
A1, S1,
A2, S2
(match
inputs)
DR
(data
ready)
D0 to D7
(interface
bus)
Symbol
tSL(CS-WR)
tHL(CS-WR)
tSH(CS-WR)
tHH(CS-WR)
tSL(CS-RD)
tHL(CS-RD)
tSH(CS-RD)
tHH(CS-RD)
tS(C/D-WR)
tH(C/D-WR)
tS(C/D)-RD)
tH(C/D-RD)
tS(match-WR)
tH(match-WR)
tS(match-RD)
tH(match-RD)
tW
tPD
tS(BUS-WR)
tH(BUS-WR)
Parameter
Low level setup time
to WR falling edge
Low Level hold time
from WR rising edge
High Level setup time
to WR falling edge
High level hold time
from WR rising edge
Low level setup time
to RD falling edge
Low level hold time
from RD rising edge
High level setup time
RD falling edge
High level hold time
from RD
Setup time to write
strobe end
Hold time from
write strobe end
Setup time to read
strobe start
Hold time from read
strobe end
Setup time to write
strobe end
Hold time from
strobe end
Setup time to read
strobe start
Hold time from read
strobe end
Low state width
DR output delay
from write strobe end
(active command)
Input setup time to
write strobe end
Input hold time
from write strobe end
Test Condition
Active Case
Active Case
Inactive Case
Inactive Case
Active Case
Active Case
Inactive Case
Inactive Case
Instructions 5 and 6
Instruction 5, CL =
150pF
tPD(BUS)
tHZ(BUS)
Propagation time
from (active) falling
Edge of read strobe
Propagation time
from (active) rising
Edge of read strobe
to high impedance state
CL = 200pF
CL = 200pF
A.C. TESTING, OUTPUT WAVEFORM
M3488
Min. Typ. Max. Unit
0
ns
0
ns
0
ns
0
ns
0
ns
0
ns
0
ns
0
ns
130
15
20
20
130
15
20
20
4.tCK
ns
ns
ns
ns
ns
ns
ns
ns
2.tCK
ns
7.tCK
ns
130
ns
15
ns
120
ns
80
ns
A.C. testing inputs are driven at 2.4V for a logic ”1” and 0.45V for a logic ”0”, timing measurement are made at
2.0V for a logic ”1”and 0.8V for a logic ”0”.
7/18

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