HCPL-2612 Ver la hoja de datos (PDF) - HP => Agilent Technologies
Número de pieza
componentes Descripción
Fabricante
HCPL-2612 Datasheet PDF : 15 Pages
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PULSE GEN. I I
1
ZO = 50 Ω
tf = tr = 5 ns
2
INPUT
MONITORING
3
NODE
RM
4
VCC 8
7
6
GND 5
+5 V
0.1µF
BYPASS RL
OUTPUT VO
MONITORING
*CL
NODE
*CL IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
INPUT
II
OUTPUT
VO
tPHL
tPLH
I I = 7.50 mA
I I = 3.75 mA
1.5 V
100
VCC = 5 V
II = 7.5 mA
80
tPLH , RL = 4 KΩ
tPHL , RL = 350 Ω
1 KΩ
60
4 KΩ
40
tPLH , RL = 1 KΩ
tPLH , RL = 350 Ω
20
0
-60 -40 -20 0 20 40 60 80 100
TA – TEMPERATURE – °C
Figure 6. Test Circuit for tPHL and tPLH.
105
VCC = 5 V
TA = 25°C
90
tPLH , RL = 4 KΩ
75
tPLH , RL = 350 Ω
60
tPLH , RL = 1 KΩ
45 tPHL , RL = 350 Ω
1 KΩ
30
4 KΩ
5
7
9
11 13
15
II – PULSE INPUT CURRENT – mA
40
RL = 4 kΩ
30
VCC = 5 V
II = 7.5 mA
20
RL = 350 kΩ
10
Figure 7. Typical Propagation Delay
vs. Temperature.
0
-10
-60 -40 -20
RL = 1 kΩ
0 20 40 60 80 100
TA – TEMPERATURE – °C
Figure 8. Typical Propagation Delay
vs. Pulse Input Current.
Figure 9. Typical Pulse Width
Distortion vs. Temperature.
PULSE GEN.
ZO = 50 Ω
tf = tr = 5 ns
INPUT VE
MONITORING NODE
1
7.5 mA
II
2
3
4
VCC 8
7
6
GND 5
+5 V
0.1 µF
BYPASS
RL
OUTPUT VO
MONITORING
*CL
NODE
*CL IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
INPUT
VE
OUTPUT
VO
tEHL
t ELH
3.0 V
1.5 V
1.5 V
Figure 10. Test Circuit for tEHL and tELH.
120
VCC = 5 V
VEH = 3 V
VEL = 0 V
90 II = 7.5 mA
tELH, RL = 4 kΩ
60
tELH, RL = 1 kΩ
30
tELH, RL = 350 Ω
0
tEHL, RL = 350 Ω, 1 kΩ, 4 kΩ
-60 -40 -20 0 20 40 60 80 100
TA – TEMPERATURE – °C
Figure 11. Typical Enable Propagation
Delay vs. Temperature.
1-323
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