UPC3224TB Ver la hoja de datos (PDF) - California Eastern Laboratories.

Número de pieza

componentes Descripción

Fabricante

UPC3224TB

BIPOLAR ANALOG INTEGRATED CIRCUIT

California Eastern Laboratories. 

UPC3224TB

TEST CIRCUIT

VCC

C4

1 000 pF

1 000 pF

C3

6

50 Ω

IN

C1

1

100 pF

4

C2

50 Ω

OUT

100 pF

2, 3, 5

The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.

COMPONENTS OF TEST CIRCUIT FOR

MEASURING ELECTRICAL CHARACTERISTICS

Type

Value

C1, C2

Chip Capacitor

100 pF

C3

Chip Capacitor

1 000 pF

C4

Feed-through Capacitor 1 000 pF

CAPACITORS FOR THE VCC, INPUT AND OUTPUT PINS

Capacitors of 1000 pF are recommendable as the bypass capacitor for the VCC pin and the coupling capacitors for

the input and output pins.

The bypass capacitor connected to the VCC pin is used to minimize ground impedance of VCC pin. So, stable bias

can be supplied against VCC fluctuation.

The coupling capacitors, connected to the input and output pins, are used to cut the DC and minimize RF serial

impedance. Their capacitances are therefore selected as lower impedance against a 50 Ω load. The capacitors thus

perform as high pass filters, suppressing low frequencies to DC.

To obtain a flat gain from 100 MHz upwards, 1 000 pF capacitors are used in the test circuit. In the case of under

10 MHz operation, increase the value of coupling capacitor such as 10 000 pF. Because the coupling capacitors are

determined by equation, C = 1/(2 πRfc).

6

Data Sheet PU10490EJ01V0DS

Share Link: