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NSI45025AT1G(2009) Ver la hoja de datos (PDF) - ON Semiconductor

Número de pieza
componentes Descripción
Fabricante
NSI45025AT1G
(Rev.:2009)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
NSI45025AT1G Datasheet PDF : 6 Pages
1 2 3 4 5 6
NSI45025AT1G
TYPICAL PERFORMANCE CURVES
Minimum FR4 @ 300 mm2, 1 oz Copper Trace, Still Air
60
50
40
30
20
10
VR
0
10
20
10
0
10 20 30 40 50 60
Vak, ANODECATHODE VOLTAGE (V)
Figure 1. General Performance Curve for CCR
31
30
TA = 25°C
29
35
30
TA = 40°C
[ 0.061 mA/°C
25
TA = 25°C
typ @ Vak = 7.5 V
20
TA = 85°C
[ 0.055 mA/°C
15
typ @ Vak = 7.5 V
10
5
DC Test Steady State, Still Air
0
0 1 2 3 4 5 6 7 8 9 10
Vak, ANODECATHODE VOLTAGE (V)
Figure 2. Steady State Current (Ireg(SS)) vs.
AnodeCathode Voltage (Vak)
28
Vak @ 7.5 V
27 TA = 25°C
26
28
27
26
25
3.0
NonRepetitive Pulse Test
4.0 5.0 6.0 7.0 8.0 9.0 10
Vak, ANODECATHODE VOLTAGE (V)
Figure 3. Pulse Current (Ireg(P)) vs.
AnodeCathode Voltage (Vak)
30
Vak @ 7.5 V
29
TA = 25°C
28
27
26
25
24
0
5
10
15
20
25
30
35
TIME (s)
Figure 5. Current Regulation vs. Time
25
24
23
22
26
27
28
29
30
31
32
33
Ireg(P), PULSE CURRENT (mA)
Figure 4. Steady State Current vs. Pulse
Current Testing
800
700
500 mm2/2 oz
600
500 mm2/1 oz
500
300 mm2/2 oz
400 300 mm2/1 oz
300
200 100 mm2/1 oz
100 mm2/2 oz
100
40 20
0
20
40
60
80
TA, AMBIENT TEMPERATURE (°C)
Figure 6. Power Dissipation vs. Ambient
Temperature @ TJ = 1505C
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