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MX27C1000DC-45 Ver la hoja de datos (PDF) - Macronix International

Número de pieza
componentes Descripción
Fabricante
MX27C1000DC-45
MCNIX
Macronix International MCNIX
MX27C1000DC-45 Datasheet PDF : 18 Pages
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INDEX
MX27C1000/1001
PROGRAM INHIBIT MODE
Programming of multiple MX27C1000/1001s in parallel
with different data is also easily accomplished by using
the Program Inhibit Mode. Except for CE and OE, all
like inputs of the parallel MX27C1000/1001 may be
common. A TTL low-level program pulse applied to an
MX27C1000/1001 CE input with VPP = 12.5 ± 0.5 V and
PGM LOW will program that MX27C1000/1001. A high-
level CE input inhibits the other MX27C1000/1001s from
being programmed.
PROGRAM VERIFY MODE
Verification should be performed on the programmed bits
to determine that they were correctly programmed. The
verification should be performed with OE and CE at VIL,
PGM at VIH, and VPP at its programming voltage.
AUTO IDENTIFY MODE
The auto identify mode allows the reading out of a binary
code from an EPROM that will identify its manufacturer
and device type. This mode is intended for use by
programming equipment for the purpose of automatically
matching the device to be programmed with its
corresponding programming algorithm. This mode is
functional in the 25°C ± 5°C ambient temperature range
that is required when programming the MX27C1000/
1001.
To activate this mode, the programming equipment must
force 12.0 ± 0.5 V on address line A9 of the device. Two
identifier bytes may then be sequenced from the device
outputs by toggling address line A0 from VIL to VIH. All
other address lines must be held at VIL during auto
identify mode.
Byte 0 ( A0 = VIL) represents the manufacturer code,
and byte 1 (A0 = VIH), the device identifier code. For
the MX27C1000/1001, these two identifier bytes are
given in the Mode Select Table. All identifiers for
manufacturer and device codes will possess odd parity,
with the MSB (DQ7) defined as the parity bit.
READ MODE
The MX27C1000/1001 has two control functions, both
of which must be logically satisfied in order to obtain data
at the outputs. Chip Enable (CE) is the power control
and should be used for device selection. Output Enable
(OE) is the output control and should be used to gate
data to the output pins, independent of device selection.
Assuming that addresses are stable, address access time
(tACC) is equal to the delay from CE to output (tCE). Data
is available at the outputs tQE after the falling edge of
OE, assuming that CE has been LOW and addresses
have been stable for at least tACC - tQE.
STANDBY MODE
The MX27C1000/1001 has a CMOS standby mode which
reduces the maximum VCC current to 100 uA. It is placed
in CMOS standby when CE is at VCC ± 0.3 V. The
MX27C1000/1001 also has a TTL-standby mode which
reduces the maximum VCC current to 1.5 mA. It is placed
in TTL-standby when CE is at VIH. When in standby
mode, the outputs are in a high-impedance state,
independent of the OE input.
TWO-LINE OUTPUT CONTROL FUNCTION
To accommodate multiple memory connections, a two-
line control function is provided to allow for:
1. Low memory power dissipation,
2. Assurance that output bus contention will not occur.
It is recommended that CE be decoded and used as the
primary device-selecting function, while OE be made a
common connection to all devices in the array and
connected to the READ line from the system control bus.
This assures that all deselected memory devices are in
their low-power standby mode and that the output pins
are only active when data is desired from a particular
memory device.
SYSTEM CONSIDERATIONS
During the switch between active and standby conditions,
transient current peaks are produced on the rising and
falling edges of Chip Enable. The magnitude of these
transient current peaks is dependent on the output
capacitance loading of the device. At a minimum, a 0.1
uF ceramic capacitor (high frequency, low inherent
inductance) should be used on each device between VCC
and GND to minimize transient effects. In addition, to
overcome the voltage drop caused by the inductive effects
of the printed circuit board traces on EPROM arrays, a
4.7 uF bulk electrolytic capacitor should be used between
VCC and GND for each eight devices. The location of
the capacitor should be close to where the power supply
is connected to the array.
P/N: PM0234
REV. 5.3, MAY 07, 1998
3

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