HEF4013BT(2015) Ver la hoja de datos (PDF) - NXP Semiconductors.

Número de pieza

componentes Descripción

Fabricante

HEF4013BT
(Rev.:2015)

Dual D-type flip-flop

NXP Semiconductors. 

Nexperia

HEF4013B

Dual D-type flip-flop

9''

9,

*

92

'87

57

&/

DDJ

Fig 6.

Test and measurement data is given in Table 10;

Definitions test circuit:

DUT = Device Under Test.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

Test circuit for measuring switching times

Table 10. Test data

Supply voltage

VDD

5 V to 15 V

Input

VI

VSS or VDD

tr, tf

 20 ns

Load

CL

50 pF

HEF4013B

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 9 — 10 December 2015

© Nexperia B.V. 2017. All rights reserved

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