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DLO32F-5 Ver la hoja de datos (PDF) - Data Delay Devices

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DLO32F-5 Datasheet PDF : 4 Pages
1 2 3 4
DLO32F
DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width Low:
PWIN = 10 x Clock Period
Period:
PERIN = 20 x Clock Period
OUTPUT:
Load:
Cload:
Threshold:
1 FAST-TTL Gate
5pf ± 10%
1.5V (Rising & Falling)
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
OUT
PULSE
GENERATOR TRIG
GB
C1
DEVICE UNDER
TEST (DUT)
C2
FREQUENCY
COUNTER
IN
TRIG
OSCILLOSCOPE
Test Setup
TFALL
PWIN
PERIN
TRISE
INPUT
SIGNAL
2.4V
1.5V
0.6V
VIL
2.4V
1.5V
0.6V
VIH
TEO
OUTPUT
SIGNAL
1.5V
VOH
1.5V
VOL
Timing Diagram For Testing
Doc #98002
DATA DELAY DEVICES, INC.
4
3/17/98
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com

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