MITSUBISHI <CONTROL / DRIVER IC>
M56710FP
F2F MAGNETIC STRIPE ENCORDING CARD READER
5. Testing of VTH+2, VTH-2, VOL3, VOH3
6. Testing of VTH+4, VTH-4
VCC
VCC
(ON at VOL3 and VOH3)
5kΩ
IF2F
VM.F2F
V VOL3 5kΩ
VOH3
VPKI
CVR
LDI
F2F
PKO
PKI
AMP
HD2
HD1
VRF
GND
VCC1
VCC2
CX1
CX2
IB1
IB2
INV
CLS
RDT
RCP
COSC
VLDI
LDI
F2F
PKO
PKI
AMP
HD2
HD1
VRF
GND
VCC1
VCC2
CX1
CX2
IB1
IB2
INV
CLS
RDT
RCP
VM.CLS
V
VCC
VPKI
0V
“H”
VM.F2F
“L”
VPKI+
VPKI-
VTH+2 = VREF-VPKI-
VTH-2 = VREF-VPKI+
VCC
VLDI
0V
“H”
VM.CLS
“L”
VTH+4
VTH-4
7. Testing of TOW, TOD, TNW
RCP
VCC
RDD
5kΩ
CVR
LDI
F2F
PKO
PKI
AMP
HD2
HD1
VRF
GND
VCC1
VCC2
CX1
CX2
IB1
IB2
INV
CLS
RDT
RCP
CLK
fosc duty
50%
CLK
Oscilloscope
(ON at TNW)
VCC
INV
0V
RCP
TOW
TOD
TOD
Noise input
TNW
TNW, a negative noise put into INV
input, is the maximum time interval not
considered INV input.