AN8010M Ver la hoja de datos (PDF) - Panasonic Corporation
Número de pieza
componentes Descripción
Fabricante
AN8010M Datasheet PDF : 7 Pages
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s Electrical Characteristics (Ta=25˚C)
· AN8045/AN8045M (4.5V Type)
Parameter
Symbol
Condition
min typ max Unit
Output voltage
Line regulation
Load regulation
VO
REGIN
REGL
Tj=25˚C
VI=5 to 10.5V, Tj=25˚C
IO=1 to 40mA, Tj=25˚C
IO=1 to 50mA, Tj=25˚C
4.32
4.5 4.68
V
4
50 mV
11
35 mV
23
45 mV
Minimum I/O voltage difference
VDIF (min.)
VI=4.3V, IO=20mA, Tj=25˚C
VI=4.3V, IO=50mA, Tj=25˚C
0.07 0.2
V
0.12 0.3
V
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Ibias
RR
Vno
∆VO/Ta
IO=0mA, Tj=25˚C
VI=5.5 to 7.5V, f=120Hz
f=10Hz to 100kHz
Tj=–30 to+125˚C
0.7
54
66
85
0.23
1 mA
dB
µV
mV/˚C
Note1) The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=5.5V, IO=20mA, CO=10µF
· AN8005/AN8005M (5V Type)
Parameter
Symbol
Condition
min typ max Unit
Output voltage
Line regulation
Load regulation
VO
REGIN
REGL
Tj=25˚C
VI=5.5 to 11V, Tj=25˚C
IO=1 to 40mA, Tj=25˚C
IO=1 to 50mA, Tj=25˚C
4.8
5 5.2
V
4.5
50 mV
12
40 mV
25
50 mV
Minimum I/O voltage difference
VDIF (min.)
VI=4.8V, IO=20mA, Tj=25˚C
VI=4.8V, IO=50mA, Tj=25˚C
0.07 0.2
V
0.12 0.3
V
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Ibias
RR
Vno
∆VO/Ta
IO=0mA, Tj=25˚C
VI=6 to 8V, f=120Hz
f=10Hz to 100kHz
Tj=–30 to+125˚C
0.7
52
64
95
0.25
1 mA
dB
µV
mV/˚C
Note1) The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=6V, IO=20mA, CO=10µF
· AN8006/AN8006M (6V Type)
Parameter
Symbol
Condition
min typ max Unit
Output voltage
Line regulation
Load regulation
VO
REGIN
REGL
Tj=25˚C
VI=6.5 to 12V, Tj=25˚C
IO=1 to 40mA, Tj=25˚C
IO=1 to 50mA, Tj=25˚C
5.76
6 6.24
V
5.5
60 mV
13
45 mV
28
55 mV
Minimum I/O voltage difference
VDIF (min.)
VI=5.8V, IO=20mA, Tj=25˚C
VI=5.8V, IO=50mA, Tj=25˚C
0.07
0.2
V
0.13
0.3
V
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Ibias
RR
Vno
∆VO/Ta
IO=0mA, Tj=25˚C
VI=7 to 9V, f=120Hz
f=10Hz to 100kHz
Tj=–30 to+125˚C
0.7
1.2 mA
51
63
dB
105
µV
0.3
mV/˚C
Note1) The specified condition Tj=25˚C means that the test should be conducted with each test time reduced (within 10ms) so that
the drift in characteristic value due to a temperature rise at chip junction can be ignored.
Note2) Unless otherwise specified, VI=7V, IO=20mA, CO=10µF
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