ADE7757–Typical Performance Characteristics
602k⍀
220V 200⍀ 150nF
40A TO
40mA
350⍀
200⍀
150nF
200⍀
150nF
200⍀
150nF
1F 100nF
VDD
100nF
10F
VDD
V2P
F1
F2
U1
ADE7757 CF
V2N
REVP
V1P
RCLKIN
V1N
S0
REFIN/OUT
S1
SCF
AGND DGND
6.2k⍀
10nF
U3
K7
K8
PS2501-1
VDD
10k⍀
10nF 10nF
Figure 2. Test Circuit for Performance Curves
0.5
PF = 1
0.4 ON-CHIP REFERENCE
0.3
0.2
+25؇C
+85؇C
0.1
0
–0.1
–40؇C
–0.2
–0.3
–0.4
–0.5
0.01
0.1
1
10
100
CURRENT – A
TPC 1. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 1)
1.0
PF = 1
0.8 EXTERNAL REFERENCE
0.6
+85؇C
0.4
0.2
+25؇C
0
–0.2
–0.4
–0.6
–40؇C
–0.8
–1.0
0.01
0.1
1
10
100
CURRENT – A
TPC 3. Error as a % of Reading over Temperature
with External Reference (PF = 1)
0.9
PF = 0.5
ON-CHIP REFERENCE
0.7
–40؇C, PF = 0.5
0.5
+85؇C, PF = 0.5
0.3
0.1
+25؇C, PF = 1.0
–0.1
–0.3
–25؇C, PF = 0.5
–0.5
0.01
0.1
1
10
100
CURRENT – A
TPC 2. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 0.5)
1.0
PF = 0.5
0.8 EXTERNAL REFERENCE
0.6
0.4
+85؇C, PF = 0.5
0.2
0
–0.2
+25؇C, PF = 1.0
+25؇C, PF = 0.5
–0.4
–40؇C, PF = 0.5
–0.6
–0.8
–1.0
0.01
0.1
1
10
100
CURRENT – A
TPC 4. Error as a % of Reading over Temperature
with External Reference (PF = 0.5)
–6–
REV. A