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ADE7757

Energy Metering IC with Integrated Oscillator

Analog Devices 

ADE7757

ABSOLUTE MAXIMUM RATINGS1

(TA = 25°C, unless otherwise noted.)

VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V

VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V

Analog Input Voltage to AGND

V1P, V1N, V2P, and V2N . . . . . . . . . . . . . . . . –6 V to +6 V

Reference Input Voltage to AGND . . .

Digital Input Voltage to DGND . . . . .

Digital Output Voltage to DGND . . . .

Operating Temperature Range

–0.3 V to VDD + 0.3 V

–0.3 V to VDD + 0.3 V

–0.3 V to VDD + 0.3 V

Industrial (A, B Versions) . . . . . . . . . . . . . –40°C to +85°C

Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C

Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C

16-Lead Plastic SOIC, Power Dissipation . . . . . . . . . 350 mW

␪JA Thermal Impedance2 . . . . . . . . . . . . . . . . . . . 124.9°C/W

Lead Temperature, Soldering

Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 215°C

Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C

NOTES

1 Stresses above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. This is a stress rating only; functional operation of the

device at these or any other conditions above those listed in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

2 JEDEC 1S Standard (2-layer) Board Data.

ORDERING GUIDE

Model

Package Description Package Options

ADE7757ARN

SOIC Narrow-Body

ADE7757ARNRL SOIC Narrow-Body

in Reel

EVAL-ADE7757EB Evaluation Board

ADE7757ARN-REF Reference Design

RN-16

RN-16

Evaluation Board

Reference Design

TERMINOLOGY

Measurement Error

The error associated with the energy measurement made by the

ADE7757 is defined by the following formula

%Error = Energy Registered by ADE7757–True Energy ¥ 100%

True Energy

Phase Error between Channels

The HPF (high-pass filter) in the current channel (Channel V1)

has a phase lead response. To offset this phase response and

equalize the phase response between channels, a phase correc-

tion network is also placed in Channel V1. The phase correction

network matches the phase to within ±0.1° over a range of 45 Hz

to 65 Hz, and ± 0.2° over a range 40 Hz to 1 kHz (see Figures

11 and 12).

Power Supply Rejection

This quantifies the ADE7757 measurement error as a percent-

age of reading when the power supplies are varied.

For the ac PSR measurement, a reading at nominal supplies

(5 V) is taken. A 200 mV rms/100 Hz signal is then introduced

onto the supplies and a second reading is obtained under the

same input signal levels. Any error introduced is expressed as a

percentage of reading—see the Measurement Error definition.

For the dc PSR measurement, a reading at nominal supplies

(5 V) is taken. The supplies are then varied ± 5% and a second

reading is obtained with the same input signal levels. Any error

introduced is again expressed as a percentage of reading.

ADC Offset Error

This refers to the small dc signal (offset) associated with the

analog inputs to the ADCs. However, the HPF in Channel V1

eliminates the offset in the circuitry. Therefore, the power cal-

culation is not affected by this offset.

Frequency Output Error (CF)

The frequency output error of the ADE7757 is defined as the

difference between the measured output frequency (minus

the offset) and the ideal output frequency. The difference is

expressed as a percentage of the ideal frequency. The ideal

frequency is obtained from the ADE7757 transfer function

(see the Transfer Function section).

Gain Error

The gain error of the ADE7757 is defined as the difference

between the measured output frequency (minus the offset) and

the ideal output frequency. The difference is expressed as a

percentage of the ideal frequency. The ideal frequency is obtained

from the ADE7757 transfer function (see the Transfer Function

section).

Oscillator Frequency Tolerance

The oscillator frequency tolerance of the ADE7757 is defined as

part-to-part frequency variation in terms of percentage at room

temperature (25°C). It is measured by taking the difference

between the measured oscillator frequency and the nominal

frequency defined in the Specifications section.

Oscillator Frequency Stability

Oscillator frequency stability is defined as frequency variation

in terms of parts-per-million drift over the operating tem-

perature range. In a metering application, the temperature

range is –40°C to +85°C. Oscillator frequency stability is

measured by taking the difference between the measured

oscillator frequency at –40°C and +85°C and the measured

oscillator frequency at +25°C.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection. Although the

ADE7757 features proprietary ESD protection circuitry, permanent damage may occur on devices

subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended

to avoid performance degradation or loss of functionality.

–4–

REV. A

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