DZ2418000L Ver la hoja de datos (PDF) - Panasonic Corporation
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Fabricante
DZ2418000L Datasheet PDF : 5 Pages
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Doc No. TT4-EA-13797
Revision. 3
DZ2418000L
Silicon epitaxial planar type
For constant voltage / For surge absorption circuit
Capability of withstanding a high surge type
DZ2W180 in Power type package
Features
Excellent rising characteristics of zener current Iz
Low zener operating resistance Rz
Halogen-free / RoHS compliant
(EU RoHS / UL-94 V-0 / MSL:Level 1 compliant)
Product Standards
Zener Diode
DZ2418000L
2.4
2
Unit: mm
0.15
Marking Symbol: YJ
Packaging
Embossed type (Thermo-compression sealing) : 3 000 pcs / reel (standard)
1
1.75
1. Cathode
2. Anode
0.85
Absolute Maximum Ratings Ta = 25 C
Parameter
Symbol
Rating
Panasonic
Unit
JEITA
TMiniP2-F2-B
SC-110A
Repetitive peak forward current
IFRM
500
mA
Code
―
Forward current
IF
400
mA
Total power dissipation *1
PT
2
W
Non-repetitive reverse power surge *2
PZSM
100
W
Electrostatic discharge *3
ESD
±30
kV
Junction temperature
Tj
150
°C
Internal Connection
2
Operating ambient temperature
Topr -40 to +85
°C
Storage temperature
Tstg -55 to +150 °C
Note: *1 Mounted on ceramics print circuit board.
Board size: 50 mm × 50 mm
Board thickness: 0.8 mm
1
Soldering size: 2 mm × 2 mm
*2 t = 0.1ms
*3 Test method:IEC61000_4_2(C = 150 pF,R = 330 , Contact discharge:10 times)
Electrical Characteristics Ta = 25 C 3 C
Parameter
Symbol
Conditions
Min Typ Max Unit
Forward voltage
Zener voltage *1, *2
Zener operating resistance
Reverse current
VF IF = 200 mA
VZ IZ = 10 mA
RZ IZ = 10 mA
IR VR = 13.0 V
1.2
V
17.10 18.00 18.90
V
30
10
μA
Temperature coefficient of zener voltage *3 SZ IZ = 10 mA
15.8
mV/°C
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 Measuring methods for Diodes.
2. Absolute frequency of input and output is 5 MHz.
3. *1 The temperature must be controlled 25°C for VZ mesurement.
VZ value measured at other temperature must be adjusted to VZ (25°C)
*2 VZ guaranted 20 ms after current flow.
*3 Tj = 25°C to 150°C
Page 1 of 4
Established : 2011-09-09
Revised : 2013-05-08
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