XM28C020 Ver la hoja de datos (PDF) - Xicor -> Intersil
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XM28C020 Datasheet PDF : 16 Pages
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XM28C020
A.C. CONDITIONS OF TEST
MODE SELECTION
Input Pulse Levels
0V to 3V
CE OE WE
Mode
Input Rise and
L L H Read
Fall Times
10ns
L H L Write
Input and Output
Timing Levels
1.5V
H X X Standby and Write Inhibit
X L X Write Inhibit
Output Load
1 TTL Gate and
CL = 100pF
X X H Write Inhibit
3872 PGM T05.1
A.C. CHARACTERISTICS
XM28C020 TA = 0°C to +75°C, VCC = +5V ±10%, unless otherwise specified.
XM28C020I TA = –40°C to +85°C, VCC = +5V ±10%, unless otherwise specified.
XM28C020M TA = –55°C to +125°C, VCC = +5V ±10%, unless otherwise specified.
Read Cycle Limits
I/O
DOUT
DIN
High Z
—
—
Power
Active
Active
Standby
—
—
3872 PGM T06
XM28C020-15 XM28C020-20 XM28C020-25
Symbol
tRC
tCE
tAA
tOE
tLZ(3)
tOLZ(3)
tHZ(4)
tOHZ(4)
tOH
Parameter
Read Cycle Time
Chip Enable Access Time
Address Access Time
Output Enable Access Time
CE Low to Active Output
OE Low to Active Output
CE High to High Z Output
OE High to High Z Output
Output Hold From Address Change
Min.
150
0
0
0
Read Cycle
Max.
150
150
70
100
100
Min.
200
0
0
0
Max.
200
200
80
100
100
Min.
250
0
0
0
Max.
250
250
100
100
100
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
3872 PGM T07.1
tRC
ADDRESS
tCE
CE
tOE
OE
VIH
WE
DATA I/O
HIGH Z
tOLZ
tLZ
tOH
DATA VALID
tHZ
DATA VALID
tOHZ
tAA
3872 FHD F03
Note: (3) tLZ and tOLZ are shown for reference only, they are periodically characterized and are not 100% tested.
(4) tHZ and tOHZ are measured from the point when CE or OE return high (whichever occurs first) to the time when the outputs are
no longer driven.
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