WS27C010L Ver la hoja de datos (PDF) - STMicroelectronics
Número de pieza
componentes Descripción
Fabricante
WS27C010L Datasheet PDF : 5 Pages
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AC READ TIMING DIAGRAM
WS27C010L
VIH
ADDRESSES
VIL
VIH
CE
VIL
VIH
OE
VIL
VIH
OUTPUT
VIL
ADDRESS VALID
tCE(4)
tACC
HIGH Z
tOE(4)
tOH
tDF(5)
VALID OUTPUT
HIGH Z
NOTE: 4. OE may be delayed up to tCE – tOE after the falling edge of CE without impact on tCE.
CAPACITANCE(5) TA = 25°C, f = 1 MHz
SYMBOL
PARAMETER
CONDITIONS
CIN
COUT
CVPP
Input Capacitance
Output Capacitance
VPP Capacitance
VIN = 0V
VOUT = 0V
VPP = 0 V
NOTES: 5. This parameter is only sampled and is not 100% tested.
6. Typical values are for TA = 25°C and nominal supply voltages.
TYP (6)
4
8
18
MAX
6
12
25
UNITS
pF
pF
pF
TEST LOAD (High Impedance Test Systems)
A.C. TESTING INPUT/OUTPUT WAVEFORM
2.01 V
D.U.T.
820 Ω
2.4
100 pF
0.4
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
2.0
2.0
TEST
POINTS
0.8
0.8
A.C. testing inputs are driven at 2.4 V for a logic "1" and 0.4 V
for a logic "0." Timing measurements are made at 2.0 V for a
logic "1" and 0.8 V for a logic "0".
NOTE: 7. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
4-27
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