WM2619CDT Ver la hoja de datos (PDF) - Wolfson Microelectronics plc
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WM2619CDT Datasheet PDF : 9 Pages
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Production Data
WM2619
Test Conditions:
RL = 10kΩ, CL = 100pF. VDD = 5V ± 10%, VREF = 2.048V and VDD = 3V ± 10%, VREF = 1.024V over recommended operating free-air
temperature range (unless noted otherwise)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Digital Inputs
High level input current
IIH
Input voltage = VDD
1
µA
Low level input current
IIL
Input voltage = 0V
-1
µA
Input capacitance
CI
8
pF
Notes:
1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects
of zero code and full scale errors).
2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two
codes. A guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in
digital input code.
3. Zero code error is the voltage output when the DAC input code is zero.
4. Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5. Power supply rejection ratio is measured by varying VDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on
the zero code error and the gain error.
6. Zero code error and Gain error temperature coefficients are normalised to full scale voltage.
7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as
a percentage of the full scale output voltage with a 10kΩ load.
8. IDD is measured while continuously writing code 2048 to the DAC. For VIH < VDD - 0.7V and VIL > 0.7V supply current will increase.
9. Typical supply current in power down mode is 10nA. Production test limits are wider for speed of test.
10. Slew rate results are for the lower value of the rising and falling edge slew rates.
11. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges.
Limits are ensured by design and characterisation, but are not production tested.
12. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency fOUT generated with a sampling frequency fs.
WOLFSON MICROELECTRONICS LTD
Production Data Rev1.0 June 1999
5
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