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USS810

USB 2.0 Full-Speed/Low-Speed Transceiver

Agere -> LSI Corporation 

USS810 USB 2.0

Full-Speed/Low-Speed Transceiver

Data Sheet, Rev. 6

March 2006

7 Limiting Values

7.1 Absolute Maximum Ratings

Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-

lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess of

those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended

periods can adversely affect device reliability.

Table 5. Absolute Maximum Ratings

Symbol

VDD(I/O)

VDD(3.3)

VI

Tstg

Parameter

I/O Supply Voltage

3.3 V Supply Voltage

dc Input Voltage

Storage Temperature

Conditions

—

—

—

—

Min

Max

Unit

1.7

3.3

V

3.0

3.6

V

–0.5

VDD + 0.5

V

–40

125

°C

Table 6. Recommended Operating Conditions

Symbol

VDD(I/O)

VDD(3.3)

VI

VI(AI/O)

Tamb

Parameter

Conditions

I/O Supply Voltage

3.3 V Supply Voltage

Input Voltage

—

3.3 V operation

—

Input Voltage on Analog

—

I/O Pins (D+/D–)

Operating Ambient

—

Temperature

Min

1.75

3.135

0

0

–40

Typical

—

3.3

—

—

—

Max

3.3

3.465

3.3

VDD(I/O)

85

Unit

V

V

V

V

°C

8 Static Characteristics

Table 7. Static Characteristics: Supply Pins

VDD = 3.3 V; VDD(I/O) = 1.75 V to 3.3 V; VGND = 0 V; Tamb = –40 °C to +85 °C; unless otherwise specified.

Symbol

IDD

IDD(I/O)

IDD(susp)

Parameter

Operating Supply Current

Operating I/O Supply

Current

Suspend Supply Current

Conditions

Full-speed transmit and

receive

Full-speed transmit and

receive at 12 Mbits/s

SUSPND = high

Min Typical Max

—

5

8

—

—

100

—

—

10

Unit

mA

µA

µA

6

Agere Systems Inc.

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