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UPD3734A Ver la hoja de datos (PDF) - NEC => Renesas Technology

Número de pieza
componentes Descripción
Fabricante
UPD3734A
NEC
NEC => Renesas Technology NEC
UPD3734A Datasheet PDF : 20 Pages
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µPD3734A
11. Random noise: σ
Random noise σ is defined as the standard deviation of a valid photocell output signal with 100 times (= 100
lines) data sampling at dark (light shielding).
σ (mV) =
100
(Vi V)2
i=1
100
, V=
1
100
Vi
100 i=1
Vi: A valid photocell output signal among all of the valid photocells
VOUT
V1
V2
line 1
line 2
V100
line 100
This is measured by the DC level sampling of only the signal level, not by CDS (Correlated Double Sampling).
12

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