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IDT6198S25D Ver la hoja de datos (PDF) - Integrated Device Technology

Número de pieza
componentes Descripción
Fabricante
IDT6198S25D
IDT
Integrated Device Technology IDT
IDT6198S25D Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
IDT6198S/L
CMOS STATIC RAM 64K (16K x 4-BIT)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TIMING WAVEFORM OF WRITE CYCLE NO. 1 (WE CONTROLLED TIMING)(1, 2, 3, 7)
tWC
ADDRESS
OE
CS
WE
DATAOUT
tAW
tAS
tWP
tWR
tWZ (6)
(4)
tOW (6)
(4)
tDW
tDH
DATAIN
DATA VALID
2987 drw 10
TIMING WAVEFORM OF WRITE CYCLE NO. 2 (CS CONTROLLED TIMING)(1, 2, 3)
tWC
ADDRESS
tAW
CS
tAS
tCW
tWR
WE
tDW
tDH
DATAIN
DATA VALID
2987 drw 11
NOTES:
1. WE or CS must be HIGH during all address transitions.
2. A write occurs during the overlap ( tWP) of a LOW CS and a LOW WE.
3. tWR is measured from the earlier of CS or WE going HIGH to the end of the write cycle.
4. During this period, I/O pins are in the output state so that the input signals must not be applied.
5. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state.
6. Transition is measured ±200mV from steady state.
7. If OE is LOW during a WE controlled write cycle, the write pulse width must be the larger of tWP or (tWHZ + tDW) to allow the I/O drivers to turn off and data
to be placed on the bus for the required tDW. If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the write pulse can
be as short as the specified tWP.
6.3
7

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