IDT61298SA Ver la hoja de datos (PDF) - Integrated Device Technology
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IDT61298SA Datasheet PDF : 7 Pages
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IDT61298SA
CMOS STATIC RAM 256K (64K x 4-BIT)
COMMERCIAL TEMPERATURE RANGE
DESCRIPTION (Continued)
circuitry, along with matching access and cycle times, favor
the simplified system design approach.
The IDT61298SA is packaged in a 300 mil, 28-pin SOJ,
providing improved board-level packing densities.
TRUTH TABLE(1,2)
CS OE WE I/O
L
L
H DATAOUT
L
X
L DATAIN
L
H
H High-Z
H
X
X High-Z
VHC(3) X
X High-Z
NOTES:
1. H = VIH, L = VIL, x = Don't care.
2. VLC = 0.2V, VHC = VCC -0.2V.
3. Other inputs ≥VHC or ≤VLC.
Function
Read Data
Write Data
Outputs Disabled
Deselected - Standby (ISB)
Deselected - Standby (ISB1)
2971 tbl 01
PIN CONFIGURATION
NC
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
CS
OE
GND
1
28
2
27
3
26
4
25
5
24
6
23
7
22
8 SO28-5 21
9
20
10
19
11
18
12
17
13
16
14
15
VCC
A15
A14
A13
A12
A11
A10
NC
NC
I/O3
I/O2
I/O1
I/O0
WE
2971 drw 02
SOJ
TOP VIEW
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
Com’l.
Unit
VTERM(2)
Terminal Voltage –0.5 to +7.0
V
with Respect
to GND
TA
Operating
0 to +70
°C
Temperature
TBIAS
Temperature
Under Bias
–55 to +125
°C
TSTG
Storage
Temperature
–55 to +125
°C
PT
Power Dissipation
1.0
W
IOUT
DC Output
Current
50
mA
NOTES:
2971 tbl 02
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. VTERM must not exceed VCC + 0.5V.
PIN DESCRIPTIONS
Name
A0–A14
I/O0–I/O7
CS
WE
OE
GND
VCC
Description
Addresses
Data Input/Output
Chip Select
Write Enable
Output Enable
Ground
Power
2971 tbl 04
CAPACITANCE
(TA = +25°C, f = 1.0MHz, SOJ Package)
Symbol
Parameter(1)
Conditions
Max. Unit
CIN
Input Capacitance
VIN = 3dV
5 pF
CI/O
I/O Capacitance
VOUT = 3dV
7
pF
NOTE:
2971 tbl 03
1. This parameter is determined by device characterization, but is not
production tested.
7.1
2
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