TLP2116 Ver la hoja de datos (PDF) - Toshiba
Número de pieza
componentes Descripción
Fabricante
TLP2116 Datasheet PDF : 6 Pages
| |||
Test Circuit 1: Switching Time Test Circuit
IF=12 mA (P.G)
(f=5 MHz, duty=50%,
less than tr = tf= 5 ns)
1
IF monitor
2
3
8
VCC
7
VO monitor
0.1 µF
6
CL = 15 pF
4
GND 5
SHIELD
RIN = 100 Ω
CL = 15 pF
IF
tf
VO
VCC
1.5 V
tpHL
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
Test Circuit 2: Switching Time Test Circuit
VIN=5V (P.G)
(f=5 MHz, duty=50%,
less than tr = tf= 5 ns)
VIN monitor
1
CL = 15 pF
2
3
8
VCC
7
VO monitor
0.1 µF
6
CIN = 27 pF
4
GND 5
SHIELD
RIN=430 Ω
CL=15pF
IF
tf
VO
VCC
1.5 V
tpHL
TLP2116
50%
tr
VOH
90%
10%
tpLH
VOL
50%
tr
VOH
90%
10%
tpLH
VOL
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
Test Circuit 3: Common-Mode Transient Immunity Test Circuit
1000Ｖ
90%
90%
SW
IF
→
1
AB
2
3
4
8
VCC
7
6
0.1μF
Vo
GND 5
SHIELD
VCM
10%
・SW B: IF=0mA
VCC
VO
・SW A: IF=12mA
tr
4V
tf
10%
CMH
0.4V
CML
＋
－
VCＭ
800(V)
CMH＝ tr(μs)
800(V)
CML＝- tf(μs)
© 2019
5
Toshiba Electronic Devices & Storage Corporation
2019-06-03
Share Link: 