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TLP116 Ver la hoja de datos (PDF) - Toshiba

Número de pieza
componentes Descripción
Fabricante
TLP116 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Switching Characteristics
(Unless otherwise specified, Ta=-40 to 100°C,VCC=4.5 to 5.5V)
Characteristic
Symbol
Test
Circuit
Conditions
Min
Typ.
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
IF = 012 mA RIN = 100 Ω
5
CL = 15 pF
IF = 120 mA (Note 1)
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
VIN = 05 V
RIN = 470 Ω
(IF=08 mA)
CIN = 27 pF
6
VIN = 50 V
(IF = 80 mA)
CL=15 pF
(Note 1)
Switching time dispersion
between ON and OFF
|tpHL-
tpLH|
IF = 12 mA , RIN = 100 Ω,
CL = 15 pF (Note 1)
Output fall time(90-10%)
tf
Output rise time(10-90%)
tr
5
IF = 012 mA RIN = 100 Ω
15
CL = 15 pF
IF = 120 mA (Note 1)
15
Common mode transient
immunity at high Level
output
Common mode transient
immunity at low level
output
CMH
CML
VCM = 1000 Vp-p, IF = 0 mA,
Vo(Min) = 4 V, Ta = 25 °C
10000
7
VCM = 1000 Vp-p, IF = 12 mA, -10000
Vo(Max) = 0.4 V, Ta = 25 °C
*All typical values are at Ta = 25 °C
Note 1 : CL is approximately 15pF which includes probe and Jig/stray wiring capacitance.
TLP116
Max
Unit
60
ns
60
ns
60
ns
60
ns
30
ns
ns
ns
V/us
V/us
TEST CIRCUIT 1 : VOL
IF 1
3
6
VCC
0.1uF
5
VCC
GND 4
VOL IOL
V
SHIELD
TEST CIRCUIT 2 : VOH
1
6
VCC
5
VO
IOH
V
VCC
0.1uF
3
GND 4
SHIELD
VOH = VCC - VO
TEST CIRCUIT 3 : ICCL
IF 1
6
ICCL
VCC
A
5
VCC
3
GND 4
SHIELD
TEST CIRCUIT 4: ICCH
1
6
ICCH
VCC
A
5
VCC
3
4
GND
SHIELD
© 2019
4
Toshiba Electronic Devices & Storage Corporation
2019-05-27

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