LH52256CT-70LL Ver la hoja de datos (PDF) - Sharp Electronics

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LH52256CT-70LL

CMOS 256K (32K × 8) Static RAM

Sharp Electronics 

LH52256C/CH

CMOS 256K (32K × 8) Static RAM

DC ELECTRICAL CHARACTERISTICS (TA = 0°C to +70°C, VCC = 4.5 V to 5.5 V)

PARAMETER

SYMBOL

CONDITIONS

MIN.

TYP.

MAX.

UNIT

Input leakage

current

ILI

VIN = 0 V to VCC

–1.0



1.0

µA

Output leakage

current

ILO

CE = VIH or OE = VIH

VI/O = 0 V to VCC

–1.0



1.0

µA

Operating supply

ICC

current

ICC1

Minimum cycle, VIN = VIL or VIH

II/O = 0 mA, CE = VIL

tRC, tWC = 1 µs, VIN = VIL or VIH,

II/O = 0 mA, CE = VIL





25

45.0

mA



10.0

ISB

Standby current

ISB1

CE ≥ VCC – 0.2 V

CE = VIH



0.6

40.0

µA





3.0

mA

VOL

Output voltage

VOH

NOTE:

Typical values at VCC = 5.0 V, TA = 25°C

IOL = 2.1 mA

IOH = -1.0 mA





0.4

V

2.4





AC ELECTRICAL CHARACTERISTICS

AC Test Conditions

PARAMETER

MODE

NOTE

Input pulse level

0.6 V to 2.4 V



Input rise and fall time

10 ns



Input and output timing Ref. level

1.5 V



Output load

1 TTL + CL (100 pF)

1

NOTE:

1. Including scope and jig capacitance.

READ CYCLE (TA = 0°C to +70°C, VCC = 4.5 V to 5.5 V)

PARAMETER

SYMBOL

MIN.

MAX.

UNIT

NOTE

Read cycle time

tRC

70



ns



Address access time

CE access time

Output enable to output valid

Output hold from address change

tAA



70

ns



tACE



70

ns



tOE



35

ns



tOH

10



ns



CE Low to output active

tLZ

10



ns

1

OE Low to output active

tOLZ

5



ns

1

CE High to output in High impedance

tHZ

0

30

ns

1

OE High to output in High impedance

tOHZ

0

30

ns

1

NOTES:

1. Active output to high-impedance and high-impedance to output active tests specified for a ±200 mV

transition from steady state levels into the test load.

4

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