TK15328
TEST CIRCUITS AND METHODS
SW6
VCC
SW3
SW7
50 kΩ
SW9
SW8
SW4
50 kΩ
1 kHz 10 kHz
1 Vrms 1 Vrms
or ~
~
2 Vrms
+
10 µF
10 kΩ
SW5
+
10 µF
SW2
V~
V_
33 µF +
SW1
L
H
THD
+
33 µF
1: The above condition represents 1ch.
2: The above conditions distortion rate of 1-Ach and dynamic range measurement.
3: SW5 is for residual noise measurement.
4: SW8 is for cross talk (ISO or SEP) measurement.
SW1
L
H
VEE
SUPPLY CURRENT (FIGURE 1)
CONTROL LOW/HIGH LEVEL (FIGURE 2)
This current is a consumption current with a nonloading
condition.
1) Bias supply to Pins 2,4,9,11. (This condition is the same
with other measurements, omitted from the next for
simplicity)
2) Contact Pin 5 to VCC, Pin 8 is low level or open.
2) Measure the inflow current to Pin 1 from V . This current is
CC
the supply current.
VCC A
This level is to measure the threshold level.
1) Input, the VCC to Pin 1 and input VEE to Pin 12. (This
condition is the same with other measurements, omitted
from the next for simplicity)
2) Input to Pin 4 with sine wave (f = 1 kHz, VIN = 1 Vrms).
3) Connect an oscilloscope to Pin 3.
4) Pin 8 is low level or the open, and elevate Pin 5 voltage
gradually from 0 V until the sine wave appears at the
oscilloscope. This voltage is the threshold level when
the wave appears.
VCC
+
50 K
50 K
50 K
50 K
VEE
Figure 1
June 1999 TOKO, Inc.
+
~
Cont.
Figure 2
+
VEE
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