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TGA2507-EPU Ver la hoja de datos (PDF) - TriQuint Semiconductor

Número de pieza
componentes Descripción
Fabricante
TGA2507-EPU
TriQuint
TriQuint Semiconductor TriQuint
TGA2507-EPU Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Advance Product Information
December 5, 2004
TGA2507-EPU
Chip Assembly Diagram
This configuration is for a self-bias logic pad current search with connections for bin
#1. See Table IV for alternate bin # to get the current of typical 80 ± 10% mA.
BIN No.
1
2
3
4
TABLE V
PAD CONNECTIONS
DC BIAS LADDER 1
Pad 6 to Pad 7
Pad 6 to Pad 8
Pad 6 to Pad 9
Pad 6 to Pad 10
DC BIAS LADDER 2
Pad 11 to Pad 12
Pad 11 to Pad 13
Pad 11 to Pad 14
Pad 11 to Pad 15
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process
specifications. Specifications are subject to change without notice
9
TriQuint Semiconductor Texas: Phone (972)994-8465 Fax (972)994-8504 Email: Info-mmw@tqs.com Web: www.triquint.com

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