TGA2511
TABLE IV
THERMAL INFORMATION
PARAMETER
TEST CONDITIONS
θJC Thermal Resistance
(channel to Case)
θJC Thermal Resistance
(channel to Case)
Vd = 5 V
Id = 160 mA Gate Bias
Pdiss = 0.80 W
Vd = 5 V
Id = 80 mA Self Bias
Pdiss = 0.40 W
TCH
(°C)
103.9
82.7
θJC
(°C/W)
42.4
31.7
Tm
(HRS)
3.8E+6
4.1E+7
Note: Assumes eutectic attach using 1.5 mil 80/20 AuSn mounted to a 20 mil CuMo
Carrier at 70°C baseplate temperature. Worst case condition with no RF applied, 100%
of DC power is dissipated.
Median Lifetime (Tm) vs. Channel Temperature
1.E+13
1.E+12
1.E+11
1.E+10
1.E+09
1.E+08
1.E+07
1.E+06
1.E+05
FET6
1.E+04
25
50
75
100
125
150
Channel Temperature ( °C)
4
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March 2010 © Rev A