TA8126F Ver la hoja de datos (PDF) - Toshiba

Número de pieza

componentes Descripción

Fabricante

TA8126F

TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Toshiba 

Test Circuit

TA8126S / F

Coil Data (test circuit)

Test

Frequency

3MHz

L (µH)

Q0

2-6

103

40

C0 (pF)

4-6

1-2

22

7

Turn

2-3

2

4-6

57

1

2

WIire

(mmf)

Reference

0.1 UEW (S) 4143-3099-356

(S): SUMIDA ELECTRIC & Co., Ltd.

6

2002-10-30

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