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CXD3017Q

CD Digital Signal Processor with Built-in Digital Servo and DAC

Sony Semiconductor 

CXD3017Q

1-bit DAC and LPF Block Analog Characteristics

Analog characteristics (VDD = AVDD = 3.3V, VSS = AVSS = 0V, Ta = 25°C)

Item

Symbol

Conditions

Total harmonic

distortion

THD

1kHz, 0dB data

Signal-to-noise

ratio

S/N

1kHz, 0dB data when AMUT ON

(Using A-weighting filter)

Crystal

384Fs

768Fs

384Fs

768Fs

Min.

Typ.

Max. Unit

0.0080 0.0120

%

0.0080 0.0120

98

102

dB

98

102

Fs = 44.1kHz in all cases.

The total harmonic distortion and signal-to-noise ratio measurement circuits are shown below.

Note) The external load capacitance connect to the LPF block should be 30pF or less in total.

27k

AOUT1 (2)

330pF

AIN1 (2)

27k

27k

68pF

SHIBASOKU (AM51A)

LOUT1 (2)

22µ

100k

Audio Analyzer

LPF external circuit diagram

768Fs/384Fs

DATA

TEST DISC

Rch

RF

CXD3017Q

Lch

A

Audio Analyzer

B

Block diagram of analog characteristics measurement

(VDD = AVDD = 3.3V, VSS = AVSS = 0V, Topr = –20 to +75°C)

Item

Symbol Min.

Typ.

Max. Unit Applicable pins

Output voltage

VOUT

0.71

Vrms

∗1

Load resistance

RL

20

kΩ

∗1

Load capacitance

CL

30

pF

∗1, ∗2

∗ Measurement is conducted for the LPF external circuit diagram with the sine wave output of 1kHz and 0dB.

Applicable pins

∗1 LOUT1, LOUT2

∗2 AOUT1, AOUT2

– 11 –

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