SWAF3L Ver la hoja de datos (PDF) - SEOUL SEMICONDUCTOR

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componentes Descripción

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SWAF3L

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SEOUL SEMICONDUCTOR 

Rev. 5.00

SWAF3L

7. Reliability

(1) TEST ITEMS AND RESULTS

TEST ITEM

Test conditions

Life Test 1

High Humidity Heat Life Test

Thermal Shock

High Temperature Life Test*1

Ta = 25°C; IF = 80 mA

Ta = 60°C; RH = 90%, IF = 60 mA

-30°C ~ 85°C

(30 min) (30 min)

Ta = 85°C; IF = 60mA

Low Temperature Life Test Ta = - 40°C; IF = 80 mA

High Temperature Storage Ta = 100°C

Low Temperature Storage Ta = - 40°C

Humidity Heat Storage

Ta = 60°C; RH = 90%

ESD

Human Body Mode : 1 kV

*1 TEST CONDITION : PCB (Material : FR-4, Thickness : 1.6T)

-Operating Condition : RΘ = 140 ºC/W.

Note

1,000 hr

1,000 hr

20 cycle

1,000 hr

1,000 hr

1,000 hr

1,000 hr

1,000 hr

1 time

Number of

Damaged

0/20

0/50

Reference

EIAJ ED-4701

100 101

EIAJ ED-4701

100 102

EIAJ ED-4701

300 307

0/20

-

0/20

0/50

0/50

0/20

0/50

-

EIAJ ED-4701

200 201

EIAJ ED-4701

200 202

MIL-STD

888E

(2) CRITERIA FOR JUDGING THE DAMAGE

Item

Symbol

Test Condition

Forward Voltage

VF

IF = 60 mA

Reverse Current

IR

VR = 5 V

Luminous Intensity

IV

IF = 60 mA

U.S.L. : Upper Standard Level, L.S.L. : Lower Standard Level

Criteria for Judgment

Min.

Max.

-

U.S.L × 1.2

-

U.S.L × 2.0

L.S.L × 0.7

-

SSC-QP-7-03-44(갑)

8

SEOUL SEMICONDUCTOR CO., LTD.

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