SST45LF010 Ver la hoja de datos (PDF) - Silicon Storage Technology
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Fabricante
SST45LF010 Datasheet PDF : 16 Pages
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1 Mbit Serial Flash
SST45LF010
Data Sheet
TABLE 6: CAPACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
Parameter
Description
Test Condition
Maximum
COUT1
CIN1
Output Pin Capacitance
Input Capacitance
VOUT = 0V
VIN = 0V
12 pF
6 pF
T6.1 372
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 7: RELIABILITY CHARACTERISTICS
Symbol
Parameter
Minimum Specification Units Test Method
NEND1
Endurance
10,000
Cycles JEDEC Standard A117
TDR1
Data Retention
100
Years JEDEC Standard A103
ILTH1
Latch Up
100 + IDD
mA JEDEC Standard 78
T7.1 372
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 8: AC OPERATING CHARACTERISTICS, VDD = 3.0-3.6V
Limits
Symbol
Parameter
Min
Max
Units
FCLK
TSCKH
TSCKL
TCES
TCEH
TCPH
TCHZ
TCLZ
TRLZ
TDS
TDH
TOH
TV
TWPS
TWPH
TSE
TSCE
TBP
TRST
TREC
TPURST
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
CE# Setup Time
CE# Hold Time
CE# High Time
CE# High to High-Z Output
SCK Low to Low-Z Output
RST# Low to High-Z Output
Data In Setup Time
Data In Hold Time
Output Hold from SCK Change
Output Valid from SCK
Write Protect Setup Time
Write Protect Hold Time
Sector-Erase
Chip-Erase
Byte-Program
Reset Pulse Width
Reset Recovery Time
Reset Time After Power-Up
10
MHz
45
ns
45
ns
250
ns
250
ns
250
ns
25
ns
0
ns
25
ns
20
ns
20
ns
0
ns
35
ns
10
ns
10
ns
25
ms
100
ms
20
µs
10
µs
1
µs
10
µs
T8.2 372
©2003 Silicon Storage Technology, Inc.
7
S71128-04-000 3/03 372
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