SPT7835 Ver la hoja de datos (PDF) - Fairchild Semiconductor
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SPT7835 Datasheet PDF : 12 Pages
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ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, AVDD=DVDD=OVDD=+5.0 V, VIN=0 to 4 V, ƒCLK=10 MHz, ƒS=5 MSPS, VRHS=4.0 V, VRLS=0.0 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL MIN
SPT7835
TYP
MAX
UNITS
Dynamic Performance
Total Harmonic Distortion (THD)
ƒIN = 1 MHz
Signal-to-Noise and Distortion
(SINAD)
ƒIN = 1 MHz
Spurious Free Dynamic Range
VI
59
63
dB
VI
52
57
dB
V
63
dB
Digital Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
VI
2.0
VI
VI
–10
VI
–10
V
V
0.8
V
+10
µA
+10
µA
5
pF
Digital Outputs
Logic 1 Voltage
IOH = 0.5 mA
VI
3.5
Logic 0 Voltage
IOL = 1.6 mA
VI
tRISE
15 pF load
V
tFALL
15 pF load
V
Output Enable to Data Output Delay 20 pF load, TA = +25 °C V
50 pF load over temp. V
V
0.4
V
10
ns
10
ns
10
ns
22
ns
Power Supply Requirements
Voltages
OVDD
DVDD
AVDD
Currents
AIDD
DIDD
Power Dissipation
ƒIN = 1 MHz
IV
3.0
IV
4.75
IV
4.75
VI
VI
VI
5.0
V
5.0
5.25
V
5.0
5.25
V
9
12
mA
6
10
mA
75
110
mW
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7835
3
6/27/01
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