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TGL8784-SCC(2005) Ver la hoja de datos (PDF) - TriQuint Semiconductor

Número de pieza
componentes Descripción
Fabricante
TGL8784-SCC
(Rev.:2005)
TriQuint
TriQuint Semiconductor TriQuint
TGL8784-SCC Datasheet PDF : 14 Pages
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Product Data Sheet
TGL8784-SCC
NOTES SYMBOL
4/
4/
1/,4/
1/,4/
1/
1/,4/
1/,4/
IDSS1
GM1
|VP1|
|VP2|
|VP3|
|VBRGD1|
|VBRGS1,2|
R1,2
TABLE II
DC PROBE TESTS (100%)
(TA = 25 °C + 5 °C)
TEST CONDITIONS
STD
STD
STD
STD
2/
STD
STD
3/
LIMITS
MIN
MAX
12.8
36.6
11.9
19.8
1.1
3.5
1.1
3.5
15200 102000
8
30
8
30
83.8
113.4
UNITS
mA
mS
V
V
uA
V
V
1/ VP, VBRGD, and VBRGS are negative.
2/ FET with resistors parallel across source-drain, VP current measured with –4.5V applied to gate,
+2V applied to drain, source at ground.
3/ Applied –4.5V to gate pin for resistance measurement.
4/ STD refers to Standard Test Conditions (see Table IV for definitions).
6
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com

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