SAA5249 Ver la hoja de datos (PDF) - Philips Electronics

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SAA5249

Integrated VIP and Teletext with Background Memory Controller (IVT1.1BMCX)

Philips Electronics 

Philips Semiconductors

Integrated VIP and Teletext with

Background Memory Controller

Preliminary specification

SAA5249

Group A

Table 1 Acceptance tests per lot

Mechanical

Electrical

TEST

REQUIREMENTS(1)

cumulative target: <100 ppm

cumulative target: <100 ppm

Group B

Table 2 Processability tests (by package family)

Solderability

Mechanical

Solder heat resistance

TEST

<7% LTPD

<15% LTPD

<15% LTPD

REQUIREMENTS(1)

Group C

Table 3 Reliability tests (by process family)

TEST

Operational life

CONDITIONS

168 hours at Tj = 150 °C

Humidity life

Temperature cycling performance

temperature, humidity, bias

(1000 hours, 85 °C, 85% RH or

equivalent test)

Tstg(min) to Tstg(max)

REQUIREMENTS(1)

<1500 FPM; equivalent to <100 FITS

at Tj = 70 °C

<2000 FPM

<2000 FPM

Table 4 Reliability tests (by device type)

TEST

ESD and latch-up

CONDITIONS

ESD Human body model

2000 V, 100 pF, 1.5 kΩ

ESD Machine model

200 V, 100 pF, 1.5 kΩ

latch-up 100 mA, 1.5 × VDD

(absolute maximum)

Note to Tables 1 to 4

1. ppm = fraction of defective devices, in parts per million.

LTPD = Lot Tolerance Percent Defective.

FPM = fraction of devices failing at test condition, in Failures Per Million.

FITS = Failures In Time Standard.

REQUIREMENTS(1)

<15% LTPD

<15% LTPD

<15% LTPD

1996 Nov 07

9

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