ELECTRICAL DATA
S3C72N2/C72N4/P72N4
Table 13-3. Main System Clock Oscillator Characteristics
(TA = – 40 °C + 85 °C, VDD = 1.8 V to 5.5 V)
Oscillator
Clock
Configuration
Parameter
Test Condition
Min Typ Max Units
Ceramic
XIN XOUT
Oscillation frequency
–
0.4
–
6.0 MHz
Oscillator
(1)
C1
C2
Stabilization time (2) Stabilization occurs
–
–
4
ms
when VDD is equal to
the minimum oscillator
voltage range.
Crystal
XIN XOUT
Oscillation frequency
–
0.4
–
6.0 MHz
Oscillator
(1)
External
Clock
C1
C2
Stabilization time (2) VDD = 4.5 V to 5.5 V
–
–
10 ms
VDD = 1.8 V to 4.5 V
–
–
30
XIN XOUT XIN input frequency (1)
–
0.4
–
6.0 MHz
RC
Oscillator
XIN input high and low
–
83.3 –
level width (tXH, tXL)
XIN XOUT
R
Frequency (1)
VDD = 5 V
0.4
−
R = 20 KΩ, VDD = 5 V
R = 39 KΩ, VDD = 3 V
2.0
1.0
–
ns
2 MHz
NOTES:
1. Oscillation frequency and XIN input frequency data are for oscillator characteristics only.
2. Stabilization time is the interval required for oscillator stabilization after a power-on occurs, or when stop mode is
terminated.
13-6