ST92F120V9Q7 Ver la hoja de datos (PDF) - STMicroelectronics

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ST92F120V9Q7

8/16-BIT FLASH MCU FAMILY WITH RAM, EEPROM AND J1850 BLPD

STMicroelectronics 

ST92F120 - GENERAL DESCRIPTION

voltage drop across the SCR parasitic resistor, the

SCR may be turned on; to turn off the SCR it is

necessary to remove the power supply from the

device.

The present ST9 design implements layout and

process solutions to decrease the effects of elec-

trostatic discharges (ESD) and latchup. Of course

it is not possible to test all devices, due to the de-

structive nature of the mechanism; in order to

guarantee product reliability, destructive tests are

carried out on groups of devices, according to

STMicroelectronics internal Quality Assurance

standards and recommendations.

1.2.4.2 Protective Interface

Although ST9 input/output circuitry has been de-

signed taking ESD and Latchup problems into ac-

Figure 3. Digital Input/Output - Push-Pull

count, for those applications and systems where

ST9 pins are exposed to illegal voltages and high

current injections, the user is strongly recommend-

ed to implement hardware solutions which reduce

the risk of damage to the microcontroller: low-pass

filters and clamp diodes are usually sufficient in

preventing stress conditions.

The risk of having out-of-range voltages and cur-

rents is greater for those signals coming from out-

side the system, where noise effect or uncon-

trolled spikes could occur with higher probability

than for the internal signals; it must be underlined

that in some cases, adoption of filters or other ded-

icated interface circuitries might affect global mi-

crocontroller performance, inducing undesired tim-

ing delays, and impacting the global system

speed.

I/O CIRCUITRY

P

PIN

OUTPUT

BUFFER

N

ESD PROTECTION

CIRCUITRY

EN

P

P

P

INPUT

N BUFFER

EN

N

PORT CIRCUITRY

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