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PLDC20G10-25PC

CMOS Generic 24-Pin Reprogrammable Logic Device

Cypress Semiconductor 

USE ULTRA37000™ FOR

ALL NEW DESIGNS

PLDC20G10B

PLDC20G10

Maximum Ratings

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Storage Temperature ................................. –65°C to +150°C

Ambient Temperature with

Power Applied............................................. –55°C to +125°C

Supply Voltage to Ground Potential ............... –0.5V to +7.0V

DC Voltage Applied to Outputs

in High Z State ............................................... –0.5V to +7.0V

DC Input Voltage............................................ –3.0V to +7.0V

Output Current into Outputs (LOW) .............................16 mA

DC Programming Voltage

PLDC20G10B and CG7C323B–A ............................... 13.0V

PLDC20G10 and CG7C323–A.................................... 14.0V

Latch-Up Current ..................................................... >200 mA

Static Discharge Voltage.............................................. >500V

(per MIL-STD-883, Method 8015)

Operating Range

Range

Commercial

Military[3]

Industrial

Ambient Temperature

0°C to +75°C

–55°C to +125°C

–40°C to +85°C

VCC

5V ±10%

5V ±10%

5V ±10%

Electrical Characteristics Over the Operating Range (Unless Otherwise Noted)[4]

Parameter

Description

Test Conditions

VOH

Output HIGH Voltage

VCC = Min.,

VIN = VIH or VIL

IOH = –3.2 mA

IOH = –2 mA

Com’l/Ind

Military

VOL

Output LOW Voltage

VCC = Min.,

IOL = 24 mA

Com’l/Ind

VIN = VIH or VIL

IOL = 12 mA

Military

VIH

Input HIGH Level

Guaranteed Input Logical HIGH Voltage for All Inputs[5]

VIL

Input LOW Level

Guaranteed Input Logical LOW Voltage for All Inputs[5]

IIX

Input Leakage Current

VSS ≤ VIN ≤ VCC

ISC

Output Short Circuit Current VCC = Max., VOUT = 0.5V[6, 7]

ICC

Power Supply Current

0 ≤ VIN ≤ VCC

Com’l/Ind–15, –20

VCC = Max.,

Com’l/Ind–25, –35

IOUT = 0 mA

Unprogrammed Device

Military–20, –25

Military–30, –40

IOZ

Output Leakage Current

VCC = Max., VSS ≤ VOUT ≤ VCC

Capacitance[7]

Min. Max. Unit

2.4

V

0.5

V

2.0

V

0.8

V

–10 +10 µA

–90 mA

70 mA

55 mA

100 mA

80 mA

–100 100 µA

Parameter

Description

Test Conditions

Max.

Unit

CIN

Input Capacitance

TA = 25°C, f = 1 MHz

10

pF

COUT

Output Capacitance

VIN = 2.0V, VCC = 5.0V

10

pF

Notes:

3. TA is the “instant on” case temperature.

4. See the last page of this specification for Group A subgroup testing information.

5. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.

6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid

test problems caused by tester ground degradation.

7. Tested initially and after any design or process changes that may affect these parameters.

Document #: 38-03010 Rev. *A

Page 5 of 14

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