CXA3026Q Ver la hoja de datos (PDF) - Sony Semiconductor
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CXA3026Q Datasheet PDF : 30 Pages
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CXA3026Q
Electrical Characteristics Measurement Circuit
Current Consumption Measurement Circuit
5V
5V
Sampling Delay Measurement Circuit
Aperture Jitter Measurement Circuit
100MHz
Amp
4V
VRT
1.95V
VIN
Icc
AVCC
DVCC1
DVCC2
IEE
DGND3
CLK/E
OSC1
φ: Variable
5MHz PECL
fr
OSC2
VIN
8
Logic
CXA3026Q
Analizer
CLK
1024
samples
2V
VRB
DGND2
DGND1
AGND
DVEE3
100MHz
ECL
Buffer
Integral Linearity Error Measurement Circuit
Differential Linearity Error Measurement Circuit
Aperture Jitter Measurement Method
+V
VIN
S2
S1: ON when A < B
S1 S2: ON when A > B
CLK
VRT
VRM2
VRB
VIN
DVM
8
CXA3026Q
–V
A<B A>B
Comparator
A8 B8 8
to to
A1 B1
A0 B0
“0”
“1”
Controller
Buffer
000···00
to
111···10
Error Rate Measurement Circuit
∆υ
129
∆t
VIN
128
127
σ (LSB)
126
125
CLK
Sampling timing fluctuation
(= aperture jitter)
Where σ (LSB) is the deviation of the output codes when
the largest slew rate point is sampled at the clock which
has exactly the same frequency as the analog input
signal, the aperture jitter Taj is:
Taj = σ/
∆υ
∆t
= σ/ ( 256 × 2πf )
2
Signal
Source
VIN
CXA3026Q
8
Latch
Fc
4
–1kHz
CLK
CLK
+
2Vp-p Sin Wave
Signal
Source
Fc
16LSB
1/8
–9–
Latch
A
B
Comparator
A>B
Pulse
Counter
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