74F543 Ver la hoja de datos (PDF) - Philips Electronics
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74F543 Datasheet PDF : 16 Pages
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Philips Semiconductors
Octal registered transceivers
Product specification
74F543, 74F544
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH High-level output voltage
A0 - A7,
A0 - A7
B0 - B7,
B0 - B7
"10%VCC 2.4
VCC = MIN
VIL = MAX
VIH = MIN
IOH = -3mA
IOH = -15mA
"5%VCC
"10%VCC
"5%VCC
2.7
2.0
2.0
3.4
V
V
V
V
VOL Low-level output voltage
A0 - A7,
A0 - A7
B0 - B7,
B0 - B7
VCC = MIN
VIL = MAX
VIH = MIN
IOL = 24mA
IOL = 64mA
"10%VCC
"5%VCC
"10%VCC
"5%VCC
0.35 0.50 V
0.35 0.50 V
0.55 V
0.42 0.55 V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2 V
II
Input current at maximum
input voltage
OEAB, OEBA, EAB
Others
VCC = MAX, VI = 7.0 V
VCC = 5.5, VI = 5.5V
100 µA
1 mA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20 µA
Others
–0.6 mA
IIL
Low-level input current
EAB,
EBA
VCC = MAX, VI = 0.5V
–1.2 mA
IOZH + IIH
IOZH + IIL
IOS
Off-state output current, high-level voltage applied
Off-state output current, Low-level voltage applied
Short-circuit output current3
A0 - A7,
A0 - A7
B0 - B7,
B0 - B7
VCC= MAX, VO = 2.7V
VCC= MAX, VO = 0. 5V
VCC = MAX
–60
–100
70 µA
–600 µA
–150 mA
–225 mA
ICCH
70 105 mA
74F543
ICCL
VCC = MAX
95 135 mA
ICC
Supply current (total)
ICCZ
ICCH
95 135 mA
80 110 mA
74F544
ICCL
VCC = MAX
105 140 mA
ICCZ
100 135 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under the recommended operating conditions for the applicable
type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1994 Dec 5
7
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