M95160-RMN1 Ver la hoja de datos (PDF) - STMicroelectronics
Número de pieza
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M95160-RMN1 Datasheet PDF : 19 Pages
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M95640, M95320, M95160, M95080
Figure 2A. DIP Connections
M95xxx
S1
Q2
8 VCC
7 HOLD
W3
6C
VSS 4
5D
AI01790C
Figure 2B. SO Connections
S
Q
W
VSS
M95xxx
1
8
2
7
3
6
4
5
AI01791C
VCC
HOLD
C
D
Figure 2C. TSSOP Connections
M95128
S
Q
NC
NC
NC
W
VSS
1
14
2
13
3
12
4
11
5
10
6
9
7
8
AI02346
VCC
HOLD
NC
NC
NC
C
D
Note: 1. NC = Not Connected
thousand Erase/Write cycles, with a data retention
of 40 years. The memories are organised as 8K x
8 bits and 4K x 8 bits (M95640, M95320) and 2K x
8 bits and 1K x 8 bits (M95160, M95080), and op-
erate down to 2.5 V (for the -W version of each de-
vice), and down to 1.8 V (for the -R version of each
device).
The M95640, M95320 and M95160, M95080 are
available in Plastic Dual-in-Line, Plastic Small Out-
line and Thin Shrink Small Outline packages.
Each memory device is accessed by a simple se-
rial interface that is SPI bus compatible. The bus
signals are C, D and Q, as shown in Table 1 and
Figure 3.
The device is selected when the chip select input
(S) is held low. Communications with the chip can
be interrupted using the hold input (HOLD).
Table 2. Absolute Maximum Ratings 1
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
-40 to 125
°C
TSTG
Storage Temperature
-65 to 150
°C
PSDIP8: 10 sec
260
TLEAD
Lead Temperature during Soldering
SO8: 40 sec
215
°C
TSSOP14: t.b.c.
t.b.c.
VO
Output Voltage Range
-0.3 to VCC+0.6
V
VI
Input Voltage Range
-0.3 to 6.5
V
VCC
Supply Voltage Range
-0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model) 2
4000
V
Note: 1. Except for the rating “Operating Temperature Range”, stresses above those listed in the Table “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only, and operation of the device at these or any other conditions
above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-
tions for extended periods may affect device reliability. Refer also to the ST SURE Program and other relevant quality documents.
2. MIL-STD-883C, 3015.7 (100 pF, 1500 Ω)
2/19
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