N74F827D(2004) Ver la hoja de datos (PDF) - Philips Electronics
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N74F827D Datasheet PDF : 11 Pages
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Philips Semiconductors
10-bit buffer/line driver, non-inverting (3-State)
Product data
74F827
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH
HIGH-level output voltage
VCC = MIN,
± 10% VCC
2.4
–
–
V
VIL = MAX,
VIH = MIN
IOH = –15 mA ± 5% VCC
2.4
3.3
–
V
VCC = MIN,
± 10% VCC
2.0
–
VIL = MAX,
VIH = MIN
IOH = –24 mA ± 5% VCC
2.0
–
–
V
–
V
VOL
LOW-level output voltage
VCC = MIN,
± 10% VCC
–
VIL = MAX, IOL = 64 mA
VIH = MIN
± 5% VCC
–
–
0.55
V
0.42 0.55
V
VIK
II
IIH
IIL
IOZH
Input clamp voltage
Input current at maximum input voltage
HIGH-level input current
LOW-level input current
Off-state output current,
HIGH voltage applied
VCC = MIN; II = IIK
VCC = 0 V; VI = 7.0 V
VCC = MAX; VI = 2.7 V
VCC = MAX; VI = 0.5 V
VCC = MAX; VO = 2.7 V
–
–0.73 –1.2
V
–
–
100
µA
–
–
20
µA
–
–
–20
µA
–
–
50
µA
IOZL
Off-state output current,
LOW voltage applied
VCC = MAX; VO = 0.5 V
–
–
–50
µA
IOS
Short circuit output current 3
VCC = MAX
–100
–
–225 mA
ICCH
–
50
70
mA
ICC
Supply current (total)
ICCL
VCC = MAX
–
70
100 mA
ICCZ
–
60
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under operating conditions for the applicable type.
2. All typical values are at VCC = 5 V, Tamb = 25 °C.
3. Not more than one output should be shorted at one time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter tests, IOS tests should be performed last.
2004 Jan 21
5
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