MCP6286 Ver la hoja de datos (PDF) - Microchip Technology

Número de pieza

componentes Descripción

Fabricante

MCP6286

Low Noise, Low Power Op Amp

Microchip Technology 

1.2 Test Circuits

The circuit used for most DC and AC tests is shown in

Figure 1-1. It independently sets VCM and VOUT; see

Equation 1-1. The circuit’s common mode voltage is

(VP + VM)/2, not VCM. VOST includes VOS plus the

effects of temperature, CMRR, PSRR and AOL.

EQUATION 1-1:

GDM = RF ⁄ RG

GN = 1 + GDM

VCM = VP(1 – 1 ⁄ GN) + VREF(1 ⁄ GN)

VOST = VIN– – VIN+

VOUT = VREF + (VP – VM)GDM + VOSTGN

Where:

GDM = Differential Mode Gain

GN = Noise Gain

VCM = Op Amp’s Common Mode

Input Voltage

VOST = Op Amp’s Total Input Offset

Voltage

(V/V)

(V/V)

(V)

(mV)

MCP6286

CF

6.8 pF

RG

100 kΩ

VP

VIN+

RF

100 kΩ

MCP6286

VIN–

VM

RG

100 kΩ

RF

100 kΩ

VREF = VDD/2

VDD

CB1

100 nF

CB2

1 µF

RL

10 kΩ

VOUT

CL

60 pF

CF

6.8 pF

VL

FIGURE 1-1:

AC and DC Test Circuit for

Most Specifications.

© 2009 Microchip Technology Inc.

DS22196A-page 5

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