MCP625 Ver la hoja de datos (PDF) - Microchip Technology

Número de pieza

componentes Descripción

Fabricante

MCP625

20 MHz, 2.5 mA Op Amps with mCal

Microchip Technology 

MCP621/2/5

1.3 Timing Diagram

CAL/CS

VDD

VPRH

tPON

VIH

tCOFF

VIL

tCSU

tCON

VOUT High-Z

On

High-Z

On

VPRL

tPOFF

High-Z

ISS -3 µA (typical) -2.5 mA (typical)

-3 µA (typical)

-2.5 mA (typical)

-3 µA (typical)

ICS 0 nA (typical)

FIGURE 1-1:

Timing Diagram.

0.7 µA (typical)

0 nA (typical)

1.4 Test Circuits

The circuit used for most DC and AC tests is shown in

Figure 1-2. This circuit can independently set VCM and

VOUT; see Equation 1-1. Note that VCM is not the

circuit’s common mode voltage ((VP + VM)/2), and that

VOST includes VOS plus the effects (on the input offset

error, VOST) of temperature, CMRR, PSRR and AOL.

EQUATION 1-1:

GDM = RF ⁄ RG

VCM = (VP + VDD ⁄ 2) ⁄ 2

VOST = VIN– – VIN+

VOUT = (VDD ⁄ 2) + (VP – VM) + VOST(1 + GDM)

Where:

GDM = Differential Mode Gain

VCM = Op Amp’s Common Mode

Input Voltage

VOST = Op Amp’s Total Input Offset

Voltage

(V/V)

(V)

(mV)

CF

6.8 pF

RG

10 kΩ

VP

VIN+

MCP62X

VIN–

VM

RG

10 kΩ

RF

10 kΩ

RF

10 kΩ

VDD

VDD/2

CB1

100 nF

CB2

2.2 µF

RL

2 kΩ

VOUT

CL

50 pF

CF

6.8 pF

VL

FIGURE 1-2:

AC and DC Test Circuit for

Most Specifications.

DS22188A-page 6

© 2009 Microchip Technology Inc.

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