MCP6072T-E/SL Ver la hoja de datos (PDF) - Microchip Technology
Número de pieza
componentes Descripción
Fabricante
MCP6072T-E/SL Datasheet PDF : 40 Pages
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1.3 Test Circuits
The circuit used for most DC and AC tests is shown in
Figure 1-1. This circuit can independently set VCM and
VOUT; see Equation 1-1. Note that VCM is not the
circuit’s common mode voltage ((VP + VM)/2), and that
VOST includes VOS plus the effects (on the input offset
error, VOST) of temperature, CMRR, PSRR and AOL.
EQUATION 1-1:
GDM = RF â„ RG
VCM = (VP + VDD â„ 2) â„ 2
VOST = VIN– – VIN+
VOUT = (VDD ℠2) + (VP – VM) + VOST(1 + GDM)
Where:
GDM = Differential Mode Gain
VCM = Op Amp’s Common Mode
Input Voltage
VOST = Op Amp’s Total Input Offset
Voltage
(V/V)
(V)
(mV)
MCP6071/2/4
CF
6.8 pF
RG
100 kΩ
VP
VIN+
RF
100 kΩ
MCP607X
VIN–
VM
RG
100 kΩ
RF
100 kΩ
VDD
VDD/2
CB1
100 nF
CB2
1 µF
RL
10 kΩ
VOUT
CL
60 pF
CF
6.8 pF
VL
FIGURE 1-1:
AC and DC Test Circuit for
Most Specifications.
© 2010 Microchip Technology Inc.
DS22142B-page 5
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