MC33290DR2 Ver la hoja de datos (PDF) - Freescale Semiconductor

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Fabricante

MC33290DR2

ISO K Line Serial Link Interface

Freescale Semiconductor 

ELECTRICAL CHARACTERISTICS

STATIC ELECTRICAL CHARACTERISTICS

STATIC ELECTRICAL CHARACTERISTICS

Table 3. Static Electrical Characteristics

Characteristics noted under conditions of 4.75 V ≤ VDD ≤ 5.25 V, 8.0 V ≤ VBB ≤ 18 V, -40°C ≤ TC ≤ 125°C, unless otherwise

noted.

Characteristic

Symbol

Min

Typ

Max

Unit

POWER AND CONTROL

VDD Sleep State Current

Tx = 0.8 VDD, CEN = 0.3 VDD

VDD Quiescent Operating Current

Tx = 0.2 VDD, CEN = 0.7 VDD

VBB Sleep State Current

VBB = 16 V, Tx = 0.8 VDD, CEN = 0.3 VDD

VBB Quiescent Operating Current

TX = 0.2 VDD, CEN = 0.7 VDD

Chip Enable

Input High-Voltage Threshold (8)

Input Low-Voltage Threshold (9)

Chip Enable Pull-Down Current (10)

TX Input Low-Voltage Threshold

RISO = 510 Ω (11)

TX Input High-Voltage Threshold

RISO = 510 Ω (12)

TX Pull-Up Current (13)

RX Output Low-Voltage Threshold

RISO = 510 Ω, TX = 0.2 VDD, Rx Sinking 1.0 mA

RX Output High-Voltage Threshold

RISO = 510 Ω, TX = 0.8 VDD, RX Sourcing 250 µA

Thermal Shutdown (14)

IDD(SS)

–

mA

–

0.1

IDD(Q)

–

mA

–

1.0

IBB(SS)

–

µA

–

50

IBB(Q)

–

mA

–

1.0

VIH(CEN)

VIL(CEN)

IPD(CEN)

VIL(Tx)

0.7 VDD

–

2.0

–

V

–

–

–

0.3 VDD

–

40

µA

V

–

0.3 x VDD

VIH(Tx)

0.7 x VDD

–

V

–

IPU(Tx)

-40

VOL(Rx)

–

–

-2.0

µA

V

–

0.2 VDD

VOH(Rx)

0.8 VDD

–

V

–

TLIM

150

170

–

°C

Notes

8. When IBB transitions to >100 µA.

9. When IBB transitions to <100 µA.

10. Enable pin has an internal current pull-down. Pull-down current is measured with CEN pin at 0.3 VDD.

11. Measured by ramping TX down from 0.7 VDD and noting TX value at which ISO falls below 0.2 VBB.

12. Measured by ramping TX up from 0.3 VDD and noting the value at which ISO rises above 0.9 VBB.

13. Tx pin has internal current pull-up. Pull-up current is measured with TX pin at 0.7 VDD.

14. Thermal Shutdown performance (TLIM) is guaranteed by design but not production tested.

Analog Integrated Circuit Device Data

Freescale Semiconductor

33290

5

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