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MC146010 Ver la hoja de datos (PDF) - Freescale Semiconductor

Número de pieza
componentes Descripción
Fabricante
MC146010
Freescale
Freescale Semiconductor Freescale
MC146010 Datasheet PDF : 18 Pages
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Table 1. Maximum Ratings(1) (Voltages Referenced to VSS)
Symbol
Parameter
Value
Unit
VDD
DC Supply Voltage
VIN
DC Input Voltage
IIN
IOUT
IDD
PD
DC Input Current, per Pin
DC Output Current, per Pin
DC Supply Current, VDD/VSS pins
(15 Seconds in Reverse Dir.)
Power Dissipation
-0.5 to +12
V
C1, C2, Detect
-0.25 to VDD +0.25
V
Osc, Low-Supply Trip
-0.25 to VDD +0.25
I/O
-0.25 to VDD +10
Feedback
-15 to +25
Test
-1.0 to VDD +0.25
±10
mA
±25
mA
+25 Forward
mA
-150 Reverse
† in Stil Air, 5 sec.
1200(2)
mW
†† Continuous
350(3)
Tstg
Storage Temperature
TA
Operating Temperature
TL
Lead Temperature, 1 mm from case for 10 seconds
-55 to +125
°C
-25 to +75
°C
260
°C
1. Maximum ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in
the electrical characteristics tables.
2. Derating: -12 mW/°C from 25°C to 60°C.
3. Derating: -3.5 mW/°C from 25°C to 60°C.
This device contains protection circuitry to guard against
damage due to high static voltages or electric fields.
However, precautions must be taken to avoid applications of
voltages any higher than maximum rated voltages to this
high-impedance circuit. For proper operation, VIN and VOUT
should be constrained to a range of VSS (VIN or
VOUT) VDD except for I/O pin which can exceed VDD, and
the Test/Mute input, which can go below VSS.
Unused inputs must always be tied to an appropriate logic
voltage level (e.g. either VSS or VDD). Unused outputs and/or
an unused I/O must be left open.
Table 2. Electrical Characteristics (Voltages Referenced to VSS, TA = -10 to 60°C unless otherwise indicated.)
Symbol
Parameter
Test Condition
Test
Pin
VDD
Min
Max
Unit
VDD Power Supply Voltage Range
6.0
VTH Supply Threshold Voltage, Low Supply Alarm
Low Supply Trip: VIN = VDD/3
15
7.2
IDD Average Operating Supply Current
(per Package)
(Does not include Current through D3-IR Emitter)
Standby
Configured per Figure 5
12
9.0
12
V
7.8
V
9.0
µA
7.0
IDD Peak Supply Current (per Package)
During Strobe On, IRED Off
12
1.25
mA
(Does not include IRED Current into base of Q1) Configured per Figure 5
During Strobe On, IRED On
12
2.5
Configured per Figure 5
VIL Low Level Input Voltage
I/O
Feedback
Test
7.0
9.0
1.5
V
10
9.0
2.7
16
9.0
0.5
VIM Mid Level Input Voltage
VIH High Level Input Voltage
Test
I/O
Feedback
Test
16
9.0
2.0
VDD-2.0
V
7.0
9.0
3.2
V
10
9.0
6.3
16
9.0
8.5
IIN Input Current
IIL Test Mode Input Current
OSC, Detect
Low-Supply Trip
Feedback
Test
VIN = VSS or VDD
VIN = VSS or VDD
VIN = VSS or VDD
VIN = VSS or VDD
VIN = VSS or VDD
3.12
12
-100
+100
nA
15
12
-100
+100
10
12
-100
+100
16
12
-100
+100
16
12
-100
-1.0
µA
Sensors
Freescale Semiconductor
MC146010
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