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MC146010 Ver la hoja de datos (PDF) - Freescale Semiconductor

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componentes Descripción
Fabricante
MC146010
Freescale
Freescale Semiconductor Freescale
MC146010 Datasheet PDF : 18 Pages
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The load for the low-supply test is non-coincident with the
smoke tests, chamber sensitivity test, pushbutton test, or any
alarm signals.
The LED also provides a visual indication of the detector
status as follows, assuming the component values shown in
Figure 4:
Standby (includes low-supply and chamber sensitivity
tests) — Pulses every 32.4 seconds.
Local Smoke — Pulses every 2.0 seconds (typical)
Mute — Pulses every 2.0 seconds (typical)
Remote Smoke — No Pulses
Pushbutton test — Pulses every 2.0 seconds
OSC (PIN 12)
This pin is used in conjunction with external resistor R2
(7.5 M) to VDD and external capacitor C3 (1500 pF) to VDD
to form an oscillator with a nominal period of 7.9 msec
(typical).
R1 (PIN 13)
This pin is use din conjunction with resistor R1(100 k) to
pin 12 and C3 (1500 pF, see pin 12 description) to determine
the IRED pulse width. With this RC combination, the nominal
pulse width is 105 µs.
VSS (PIN 14)
This pin is the negative supply potential and the return for
the I/O pin. Pin 14 is usually tied to Ground.
LOW-SUPPLY TRIP (PIN 15)
This pin is connected to an external voltage which
determines the low-supply alarm threshold. The trip voltage
is obtained through a resistor divider connected between the
VDD and LED pins. The low-supply alarm threshold voltage
(in volts) = (5R7/R6)+5 where R6 and R7 are in the same
units.
TEST/MUTE (PIN 16)
This input has an on-chip pull-down device and is used to
manually invoke a test mode, a mute mode, or a calibration
mode.
The Pushbutton Test mode is initiated by a high level at
Pin 16 (usually a depression of a S.P.S.T. normally-open
pushbutton switch to VDD). After one oscillator cycle, the
IRED pulses approximately every 1.0 second, regardless of
the presence of smoke. Additionally, the amplifier gain is
increased by automatic selection of C1. Therefore the
background reflections in the smoke chamber may be
interpreted as smoke, generating a simulated smoke
condition. After the second IRED pulse, a successful test
activates the horn-driver and I/O circuits. The active I/O
allows remote signaling for a system testing. When the
Pushbutton Test switch is released, the Test input returns to
VSS due to the on-chip pull-down device. After one oscillator
cycle, the amplifier gain returns to normal, thereby removing
the simulated smoke condition. After two additional IRED
pulses, less than three seconds, the IC exits the alarm mode
and returns to standby timing.
The Pushbutton Test will also activate the Alarm Memory
feature. If there was a previous alarm detected by the unit,
the horn will chirp every ¼ second as long as the Test Button
is pressed. Upon releasing of the Test Button, Alarm memory
will be reset. Subsequent pressing of the Test Button will
result in a Pushbutton Test for simulated smoke.
Pressing the Test Button while in the MUTE mode will
result in resetting of MUTE (and additionally a normal
Pushbutton Test).
The MUTE mode (IMF) is initiated by a mid level voltage
(around ½ VDD) at pin 16. A parallel Mute Button to an
existing Test Button needs to be installed at the test pin. A
smoke condition must be present for the MUTE mode to be
activated. If a no smoke condition gets detected while in the
MUTE mode, the IMF 8 minute window gets reset. The unit
will return to Standby mode.
Once in the MUTE mode, the audible smoke alarm (horn)
is temporarily disabled for approximately 8 minutes while
smoke condition is being detected. A visual smoke alarm will
remain (LED flashing) during MUTE mode. A high smoke
voltage reference will also be activated at this time.
Simultaneous smoke and high smoke sampling will allow the
unit to enable the horn driver in case a high smoke condition
occurs during MUTE where the high smoke threshold is
crossed.
The MUTE mode can be overridden by the following
conditions: 1) a no smoke condition is detected, 2) high
smoke level detected, 3) remote smoke detected through I/O,
4) reset through test Button, 5) timeout of 8 minute window.
To help prevent a jammed Mute Button condition, the divider
string on the Mute Button should include a resistor to VDD,
R15 (around 10 M) and a resistor R16 (4.7 M) and
capacitor, C7 (0.047 mF) in series to VSS.
CALIBRATION
To facilitate checking the sensitivity and calibrating smoke
detectors, the MC146010 can be placed in Calibration mode.
In this mode, certain device pins are controlled/reconfigured
as shown in Table 4. To place the part in Calibration mode,
Pin 16 (Test/ Mute) must be pulled below VSS pin with 100 µA
continuously drawn out of the pin for at least one cycle of the
OSC pin. To exit this mode, the Test/ Mute pin is floated for at
least one OSC cycle.
In the Calibration mode, the IRED pulse rate is increased.
An IRED pulse occurs every clock cycle. Also, Strobe is
always Active Low. It is recommended to short R12 (Figure 5)
in this mode. This will allow for a similar recovery of the
emitter circuitry as in normal operation. Pin 1, pin 2, and
pin 12 should be buffered with a unity gain amplifier to
measure their outputs.
MC146010
10
Sensors
Freescale Semiconductor

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