MC100EP142FA Ver la hoja de datos (PDF) - ON Semiconductor

Número de pieza

componentes Descripción

Fabricante

MC100EP142FA

3.3 V / 5 V ECL 9−Bit Shift Register

ON Semiconductor 

MC10EP142, MC100EP142

Table 3. ATTRIBUTES

Characteristics

Internal Input Pulldown Resistor

(R1)

Internal Input Pullup Resistor

(R2)

ESD Protection

Human Body Model

Machine Model

Charged Device Model

Moisture Sensitivity (Note 3)

LQFP

QFN

Flammability Rating

Oxygen Index: 28 to 34

Transistor Count

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

3. For additional information, refer to Application Note AND8003/D.

Value

75 kW

37.5 kW

> 2 kV

> 100 V

> 2 kV

Level 2

Level 1

UL−94 V−0 @ 0.125 in

405 Devices

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

Positive Power Supply

VEE

Negative Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

Iout

Output Current

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

Continuous

Surge

VI v VCC

VI w VEE

8

V

−8

V

6

V

−6

50

mA

100

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

LQFP−32

LQFP−32

−40 to +85

−65 to +150

80

55

°C

°C

°C/W

qJC

Thermal Resistance (Junction−to−Case) Standard Board

LQFP−32

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

QFN−32

QFN−32

12 to 17

31

27

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) 2S2P

QFN−32

Tsol

Wave Solder

Pb v3 sec @ 248°C

Pb−Free v3 sec @ 260°C

12

°C/W

265

°C

265

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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