AS29F010 Ver la hoja de datos (PDF) - Alliance Semiconductor
Número de pieza
componentes Descripción
Fabricante
AS29F010 Datasheet PDF : 10 Pages
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Device under test
100 pF*
1N3064
or equivalent
6.2KΩ
*including scope
and jig capacitance
GND
GND
+5V
2.7KΩ
1N3064
or equivalent
GND
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Parameter
Input voltage with respect to VSS on pin A9
Input voltage with respect to VSS on all DQ pins
Current
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at a time.
Min
Max
Unit
-1.0
+13.5 V
-1.0
VCC+1.0 V
-100
+100 mA
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Symbol
Parameter
CIN
COUT
CIN2
Input capacitance
Output capacitance
Control pin capacitance
Test setup
VIN = 0
VOUT = 0
VIN = 0
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Typical Max
Unit
6
7.5
pF
8.5
12
pF
7.5
9
µF
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Symbol
Parameter
CIN
COUT
CIN2
Input capacitance
Output capacitance
Control pin capacitance
Test setup
VIN = 0
VOUT = 0
VIN = 0
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Typical Max
Unit
4
6
pF
8
12
pF
8
12
µF
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Limits
Parameter
Min
Typical Max
Unit
Sector erase and Verify-1 time (excludes 00h programming prior to erase) -
Sector programming time
-
6.0
8.2
sec
-
8.2
sec
Chip programming time
-
48
80
sec
Erase program cycles
-
10,000 -
cycles
Byte program time
Byte verify-0 time
-
200
250
µs
-
200
250
µs
;
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